Conference Papers
Year : 2020
Alain Cucchi : Connect in order to contact the contributor
https://hal.univ-reunion.fr/hal-04570272
Submitted on : Tuesday, May 7, 2024-8:27:44 AM
Last modification on : Wednesday, May 8, 2024-3:08:47 AM
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- HAL Id : hal-04570272 , version 1
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Alain Cucchi. "Technostress appraisal: proposal for a measurement scale". 25ème Conférence Internationale de l’Association Information et Management (AIM), Association Information et Management (AIM), Jun 2020, Marrakech, Morocco. ⟨hal-04570272⟩
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