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Conference Papers Year : 2020

"Technostress appraisal: proposal for a measurement scale"

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hal-04570272 , version 1 (07-05-2024)

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  • HAL Id : hal-04570272 , version 1

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Alain Cucchi. "Technostress appraisal: proposal for a measurement scale". 25ème Conférence Internationale de l’Association Information et Management (AIM), Association Information et Management (AIM), Jun 2020, Marrakech, Morocco. ⟨hal-04570272⟩
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