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Journal Articles IEEE Design & Test Year : 2023

Fully Microstrip Three-Port Circuit Bandpass NGD Design and Test

Blaise Ravelo
Nanjing University of Information Science and Technology
Alexandre Douyère
Energy Lab
CV
Yang Liu
  • Function : Author
Wenceslas Rahajandraibe
Fayu Wan
George Chan
Mathieu Guerin
  • Function : Author

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Engineering Sciences [physics]

Alexandre DOUYERE  : Connect in order to contact the contributor

https://hal.univ-reunion.fr/hal-04110890

Submitted on : Wednesday, May 31, 2023-7:06:46 AM

Last modification on : Thursday, June 1, 2023-4:08:56 AM

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hal-04110890 , version 1 (31-05-2023)

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Blaise Ravelo, Alexandre Douyère, Yang Liu, Wenceslas Rahajandraibe, Fayu Wan, et al.. Fully Microstrip Three-Port Circuit Bandpass NGD Design and Test. IEEE Design & Test, 2023, 40 (1), pp.96-104. ⟨10.1109/MDAT.2022.3164337⟩. ⟨hal-04110890⟩

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